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  • 1
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    Journal of Applied Polymer Science 9 (1965), S. 1997-1997 
    ISSN: 0021-8995
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    Journal of Applied Polymer Science 5 (1961), S. S19 
    ISSN: 0021-8995
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Type of Medium: Electronic Resource
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  • 3
    ISSN: 0021-8995
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    Journal of Applied Polymer Science 2 (1959), S. 256-256 
    ISSN: 0021-8995
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 25 (1997), S. 799-803 
    ISSN: 0142-2421
    Keywords: Nylon-6,6 ; static SIMS ; ToF-SIMS ; polymer surface analysis ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The characteristic static SIMS spectra of the cyclic monomer of Nylon-6,6 have been obtained from the isolated and purified material. The spectra are sufficiently different from those obtained from bulk Nylon-6,6 polymer. Intense fragment ions corresponding to (M+H)+ and (M-H)- are observed in the positive and negative ion spectra, respectively. Results from both quadrupole and ToF-SIMS measurements are presented. © 1997 by John Wiley & Sons, Ltd.
    Additional Material: 3 Ill.
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  • 6
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 21 (1994), S. 553-559 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The surface compositions for a series of copoly(ether-esters) are determined from XPS and static SIMS measurements. The copolymers consist of a polybutylene terephthalate (PBT) hard block and a mixed soft block of two of the following polyethers - poly(propylene glycol) (PPG), poly(tetramethylene) oxide (PTMO) and poly(ethylene oxide) (PEO). The surfaces of all the copolymers are enriched in the total polyether soft blocks. Quantification of XPS intensities shows the presence of both polyethers at the surface of these mixed soft-block copolymers, in relative amounts close to the bulk formulations. In the static SIMS measurements, direct observation of characteristic fragment ions related to the specific polyethers confirms their presence and relative abundance in the surface.
    Additional Material: 11 Ill.
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  • 7
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    Journal of Applied Polymer Science 46 (1992), S. 1915-1925 
    ISSN: 0021-8995
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: The surface compositions of a series of poly(phenylene ether)/nylon 6,6 blends (PPE/PA), and PPE/HIPS blends, prepared by melt compounding and injection molding, have been quantitatively measured using XPS. For PPE/PA blends, the surface is dominated by the PA component for blends containing more than 25 wt % PA in the bulk. The enrichment of the PA component, which is actually the component of highest surface free energy, is rationalized in terms of the bulk morphology that consists of PPE domains in a PA continuous phase. Blends prepared by reactive extrusion processes, which form compatibilizing PPE/PA copolymers, show a decrease in surface PA enrichment with increasing copolymer content in the final blend. PPE/HIPS blends have a surface composition equal to the formulated value over the entire composition range, for both molded and solvent cast blends. The addition of 5% PVME to a 60/40 PPE/HIPS blend results in a molded surface containing 35-40 wt % PVME. © 1992 John Wiley & Sons, Inc.
    Additional Material: 10 Ill.
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  • 8
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 11 (1988), S. 160-164 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A metallization catalyst (based on the PdCl2/SnCl2 system) adsorbed on polyetherimide surfaces was characterized by x-ray photo-electron spectroscopy (XPS), Rutherford back scattering (RBS) and transmission electron microscopy (TEM). The overall Pd/Sn ratio increased from 0.2 to 3.8 when the initial sensitized surface was treated with the accelerator solution. XPS results indicated that before acceleration, only Sn(IV) (stannic hydroxide) is obserable, and after acceleration both metallic Sn and Sn(IV) are present; palladium is present primarily in a metallic form both before and after the accelerator step. Total Pd and Sn coverages were also obtained by RBS, and the total Pd/Sn ratios agree with the XPS surface measurements for specimens just prior to metallization. TEM micrographs showed the adsorbed catalyst consisted of particles 10-50 Å in size covering only a fraction of the surface.
    Additional Material: 4 Ill.
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  • 9
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 11 (1988), S. 487-496 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The interfacial reactions occurring between copper surfaces and a polyesterimide enamel coating during aging at 200°C have been investigated using XPS, AES and SEM. For coating thicknesses of 0.1 μm or greater, a copper oxide layer grows on the copper surface beneath the coating as a result of a reaction with oxygen from the atmosphere. In addition, copper becomes detectable with aging at the air/polyesterimide interface and in the bulk of the coating by surface analysis methods, indicating formation of a mobile copper species. Changes in the XPS line components indicate changes in the polyesterimide structure have occurred. Samples with very thin coatings (c. 100 Å) were also prepared and aged in an attempt to create an interface with dimensions approaching the XPS sampling depth. Upon aging, however, copper oxide grew on top of the original coating, rather than beneath it as in the case of the thicker coatings.
    Additional Material: 11 Ill.
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  • 10
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 15 (1990), S. 388-391 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Static secondary ion mass spectroscopy (SSIMS) is applied to study the surface of the miscible polystyrene (PS)/poly(vinyl methyl ether) (PVME) blend. The blend surface is enriched with PVME and the enrichment is shown to depend on the composition and molecular weight of the blend constituents. A semi-quantitative analysis of SSIMS intensities to obtain surface compositions gives good qualitative agreement with previous x-ray photoelectron spectroscopy (XPS) results.
    Additional Material: 5 Ill.
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