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  • Metals and Metallic Materials; Instrumentation and Photography; Chemistry and Materials (General)  (1)
  • Physics  (1)
  • 1
    Electronic Resource
    Electronic Resource
    New York : Wiley-Blackwell
    Journal of Polymer Science: Polymer Physics Edition 22 (1984), S. 2215-2241 
    ISSN: 0098-1273
    Keywords: Physics ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Physics
    Notes: The phenomenon of surface scattering of electromagnetic waves by single or multiple layers of films is reviewed and a special treatment for the total reflection of x rays is developed. This theory is applied to the analysis of the surface scattering observed in small-angle x-ray scattering (SAXS) studies of two-phase matter in polymers having lamella stacks or a flat interfacial boundary structure. Important features of this vector theory are the ability to calculate the surface scattering invariant, the absolute scattering intensity, and the surface roughness, which gives rise to dispersion of specular reflection from perfectly smooth surfaces. By considering the interfacial surface roughness of polystyrene crazes, the surface scattering spectrum is calculated theoretically and compared with some experimental results. Also the theory is presented in such a way as to compare surface scattering with volume scattering; i.e., both two- and three-dimensional scattering events can be simultaneously treated. This provides a new basis for quantitative analysis of crazes in polystyrene.
    Additional Material: 20 Ill.
    Type of Medium: Electronic Resource
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  • 2
    Publication Date: 2019-07-13
    Description: Elemental fractionation during laser ablation inductively coupled plasma mass spectrometry (LA-ICP-MS) analysis has been historically documented between refractory and volatile elements. In this work, however, we observed fractionation between light rare earth elements (LREEs) and heavy rare earth elements (HREEs) when using ablation strategies involving large spot sizes (greater than 100 millimeters) and line scanning mode. In addition: (1) ion yields decrease when using spot sizes above 100 millimeters; (2) (Eu/Eu*)(sub raw) (i.e. Europium anomaly) positively correlates with carrier gas (He) flow rate, which provides control over the particle size distribution of the aerosol reaching the ICP; (3) (Eu/Eu*)(sub raw) shows a positive correlation with spot size, and (4) the changes in REE signal intensity, induced by the He flow rate change, roughly correlate with REE condensation temperatures. The REE fractionation is likely driven by the slight but significant difference in their condensation temperatures. Large particles may not be completely dissociated in the ICP and result in preferential evaporation of the less refractory LREEs and thus non-stoichiometric particle-ion conversion. This mechanism may also be responsible for Sm-Eu-Gd fractionation as Eu is less refractory than Sm and Gd. The extent of fractionation depends upon the particle size distribution of the aerosol, which in turn is influenced by the laser parameters and matrix. Ablation pits and lines defined by low aspect ratios produce a higher proportion of large particles than high aspect ratio ablation, as confirmed by measurements of particle size distribution in the laser induced aerosol. Therefore, low aspect ratio ablation introduces particles that cannot be decomposed and/or atomized by the ICP and thus results in exacerbated elemental fractionation. Accurate quantification of REE concentrations and Eu/Eu* requires reduction of large particle production during laser ablation. For the reference materials analyzed in this work, the 100 millimeters spot measurements of Eu/Eu* agreed with GeoRem preferred values within 3 percent. Our long-term analyses of Eu/Eu* in MPI-DING glass KL-2G and USGS glass BIR-1G were reproducible at 3 percent (2 RSD).
    Keywords: Metals and Metallic Materials; Instrumentation and Photography; Chemistry and Materials (General)
    Type: GSFC-E-DAA-TN21399 , Journal of Analytical Atomic Spectrometry (e-ISSN 1364-5544); 29; 10; 1835-1843
    Format: text
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