Publication Date:
2019-07-13
Description:
Electron radiation damage in MOSFET devices using bias temperature treatments
Keywords:
PHYSICS, SOLID-STATE
Type:
INST. OF ELECTRICAL AND ELECTRONICS ENGINEERS, ANNUAL CONFERENCE ON NUCLEAR AND SPACE RADIATION EFFECTS; Jul 15, 1968 - Jul 18, 1968; MISSOULA, MONT.|; YAL SOCIETY (
Format:
text
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