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  • Instrumentation and Photography  (1)
  • OPTICS  (1)
  • 1
    Publication Date: 2019-07-13
    Description: Tihs is a viewgraph presentation of a discussion of the X-ray Polarimeter. Gamma-ray bursts are one of the most powerful explosions in the universe and have been detected out to distances of almost 13 billion light years. The exact origin of these energetic explosions is still unknown but the resulting huge release of energy is thought to create a highly relativistic jet of material and a power-law distribution of electrons. There are several theories describing the origin of the prompt GRB emission that currently cannot be distinguished. Measurements of the linear polarization would provide unique and important constraints on the mechanisms thought to drive these powerful explosions. We present the design of a sensitive, and extremely versatile gamma-ray burst polarimeter. The instrument is a photoelectric polarimeter based on a time-projection chamber. The photoelectric time-projection technique combines high sensitivity with broad band-pass and is potentially the most powerful method between 2 and 100 keV where the photoelectric effect is the dominant interaction process We present measurements of polarized and unpolarized X-rays obtained with a prototype detector and describe the two mission concepts, the Gamma-Ray Burst Polarimeter (GRBP) for thc U S Naval Academy satellite MidSTAR-2, and thc Low Energy Polarimeter (LEP) onboard POET, a broadband polarimetry concept for a small explorer mission.
    Keywords: Instrumentation and Photography
    Type: SPIE Conference; Aug 26, 2007 - Aug 30, 2007; San Diego, CA; United States
    Format: application/pdf
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  • 2
    Publication Date: 2019-08-28
    Description: A method whereby a concave surface is irradiated with coherent light and the resulting interference fringes yield information on the concave surface is described. This method can be applied to a surface which satisfies the following conditions: (1) the concave face has a mirror surface; (2) the profile of the face is expressed by a mathematical function with a point of inflection. In this interferometry, multilight waves reflected from the concave surface interfere and make fringes wherever the reflected light propagates. Interference fringe orders. Photographs of the fringe patterns for a uniformly loaded thin silicon plate clamped at the edge are shown experimentally. The experimental and the theoretical values of the maximum optical path difference show good agreement. This simple method can be applied to obtain accurate information on concave surfaces.
    Keywords: OPTICS
    Type: NASA-TM-77796 , NAS 1.15:77796 , Precision Instr. Acad. Spring Sci. Lecture Meeting; Mar 22, 1982; Washington, DC; United States
    Format: application/pdf
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