Publication Date:
2011-02-16
Description:
Author(s): G. van der Laan, N. D. Telling, A. Potenza, S. S. Dhesi, and E. Arenholz Photoemission electron microscopy (PEEM) with linearly polarized x rays is used to determine the orientation of antiferromagnetic domains by monitoring the relative peak intensities at the 3d transition metal L_{2} absorption edge. In such an analysis it is necessary to take into account the orienta... [Phys. Rev. B 83, 064409] Published Tue Feb 15, 2011
Keywords:
Magnetism
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics
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