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Stress Measurement by Geometrical Optics (1986)

Robinson, R. S. ; Rossnagel, S. M.

In: Other Sources

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Publikationsdatum: 2019-07-12

Beschreibung: Fast, simple technique measures stresses in thin films. Sample disk bowed by stress into approximately spherical shape. Reflected image of disk magnified by amount related to curvature and, therefore, stress. Method requires sample substrate, such as cheap microscope cover slide, two mirrors, laser light beam, and screen.

Schlagwort(e): MECHANICS

Materialart: LEW-14169 , NASA Tech Briefs (ISSN 0145-319X); 10; 2; P. 114

Format: text

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