ISSN:
0167-9317
Keywords:
IR emission microscopy
;
IR thermography
;
SEM voltage contrast
;
Semiconductor Controlled Rectifier (SCR)
;
electron beam induced current (EBIC)
;
failure analysis
;
latch-up in CMOS
;
latch-up triggering
;
layout correction
;
optical beam induced current (OBIC)
;
scanning laser microscopy
Source:
Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
Topics:
Electrical Engineering, Measurement and Control Technology
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1016/0167-9317(89)90139-1
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