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  • INSTRUMENTATION AND PHOTOGRAPHY  (1)
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    Publication Date: 2011-08-18
    Description: The minority carrier diffusion length Ln in the base or substrate region is an important parameter which governs a solar cell's performance. The present investigation is concerned with the development of a multiwavelength analyzer (MWA) technique for the nondestructive spatial testing of polycrystalline solar cells. The MWA method is based on the utilization of the short-circuit current generated by two or more light-emitting diodes (LEDs) operating at different wavelengths and modulated 180 deg out-of-phase. For a determination of Ln by the MWA technique, it is necessary to know the value of the absorption coefficient.
    Keywords: INSTRUMENTATION AND PHOTOGRAPHY
    Type: Solar Cells (ISSN 0379-6787); 9; Sept
    Format: text
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