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  • 1
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    Characterization of electron-beam induced damage structures in natural fluorite, CaF2, by analytical electron microscopy (1988)
    In:  Other Sources
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    Publication Date: 2011-08-19
    Description: This paper describes the damage structure induced in natural CaF2 by the electron beam when using TEM. The observed 10-20 nm periodic features with coherent fringe patterns and the pronounced loss of fluorine found after the TEM exposure of 100-line-oriented and 111-oriented sections of CaF2 provides support for the mechanism of damage by decomposition of CaF2 into 2F and Ca, with the Ca precipitates maintaining a close topotaxial relationship with the parent CaF2.
    Keywords: INORGANIC AND PHYSICAL CHEMISTRY
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    NASA TECHNICAL REPORTS
  • 2
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    Analytical electron microscopy of extraterrestrial materials - Results from microtome sections of carbonaceous chondrites and interplanetary dust particles (1987)
    In:  Other Sources
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    Publication Date: 2011-08-19
    Description: The paper describes a method for embedding, sectioning, and observing two types of extraterrestrial materials, including hydrated interplanetary dust particles (IDPs) and carbonaceous chondrite meteorites. The technique, which produces large thin areas suitable for both high-resolution imaging and thin-film microanalysis, was applied to study the petrology of the IDP Ames-DE C86-11, the Murchison carbonaceous chondrite matrix, and the Allende dark inclusion. The technique makes it possible to maintain delicate interfaces, boundaries, and phase relationships between grains. Because phases are held in place, layer lattice silicates and other minerals with strong preferred orientations can be viewed in any orientation, including the orientation normal to their basal planes.
    Keywords: INORGANIC AND PHYSICAL CHEMISTRY
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  • 3
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    Low voltage scanning electron microscopy of interplanetary dust particles (1987)
    In:  Other Sources
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    Publication Date: 2019-07-13
    Description: The resolution of available low-voltage SEM (LVSEM) models used in the characterization of interplanetary dust particles (IDPs) is limited by a number of factors including energy spread in the electron source, beam brightness, scanning electron detector geometry, and various lens aberrations. This paper describes an improved model of LVSEM which offers an increased resolution at low voltage. The improvements include a cold cathode FE source which has an extremely low inherent energy spread and high brightness, a second condenser lens to converge the beam and maintain an optimum aperture half-angle, and a detector optimized for low-voltage scanning-electron collection. To reduce lens aberrations, the specimen is immersed in the objective lens field. The features of several IDP samples observed using the images obtained with this LVSEM model are described.
    Keywords: INORGANIC AND PHYSICAL CHEMISTRY
    Type: Electron Microscopy Society of America; Aug 02, 1987 - Aug 07, 1987; Baltimore, MD; United States
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    NASA TECHNICAL REPORTS
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