Publication Date:
2019-07-13
Description:
Use of low-energy protons and high-energy light ions is becoming necessary to investigate current-generation SEU thresholds. Systematic errors can dominate measurements made with low-energy protons. Range and energy straggling contribute to systematic error. Low-energy proton testing is not a step-and-repeat process. Low-energy protons and high-energy light ions can be used to measure SEU cross section of single sensitive features; important for simulation.
Keywords:
Electronics and Electrical Engineering
Type:
The 18th Single Event Effects (SEE) Symposium; Apr 20, 2009 - Apr 22, 2009; La Jolla, California; United States
Format:
application/pdf
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