Publication Date:
2019-07-13
Description:
IBM 5AM SiGe HBT is device-under-test. High-speed measurement setup. Low-impedance current transient measurements. SNL, JYFL, GANIL. Microbeam to broadbeam position inference. Improvement to state-of-the-art. Microbeam (SNL) transients reveal position dependent heavy ion response, Unique response for different device regions Unique response for different bias schemes. Similarities to TPA pulsed-laser data. Broadbeam transients (JYFL and GANIL) provide realistic heavy ion response. Feedback using microbeam data. Overcome issues of LET and ion range with microbeam. **Angled Ar-40 data in full paper. Data sets yield first-order results, suitable for TCAD calibration feedback.
Keywords:
Electronics and Electrical Engineering
Type:
2009 IEEE Nuclear and Space Radiation Effects Conference; Jul 20, 2009 - Jul 24, 2009; Quebec City, Quebec; Canada
Format:
application/pdf
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