Publication Date:
2011-08-04
Description:
Author(s): A. X. Gray, A. Janotti, J. Son, J. M. LeBeau, S. Ueda, Y. Yamashita, K. Kobayashi, A. M. Kaiser, R. Sutarto, H. Wadati, G. A. Sawatzky, C. G. Van de Walle, S. Stemmer, and C. S. Fadley In order to understand the influence of strain and film thickness on the electronic structure of thin films of strongly correlated oxides, we have applied hard x-ray photoemission (HXPS) at 6 keV, soft x-ray photoemission (XPS) at 1.5 keV, and transmission electron microscopy to epitaxial LaNiO 3 fil... [Phys. Rev. B 84, 075104] Published Wed Aug 03, 2011
Keywords:
Electronic structure and strongly correlated systems
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics
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