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  • Electron microscopy determinations (including scanning tunneling electron microscopy methods)  (1)
  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Il nuovo cimento della Società Italiana di Fisica 15 (1993), S. 451-457 
    ISSN: 0392-6737
    Keywords: Electron microscopy determinations (including scanning tunneling electron microscopy methods) ; Other topics in nonelectronic transport properties ; Geometry ; atomic and molecular orientation ; crystal shapes ; surface topography
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Summary The transport and switch of Xe atoms on the Ni-W interface of a scanning tunnelling microscope have been analysed for different geometries as a function of the tip position with respect to the Ni(110) surface. Our results show that the control of the different experimental results can only be achieved by a precise control of the position of the tip on the sample. In particular, the tip-sample Xe switch can only be obtained within tip heights of 0.2Å.
    Type of Medium: Electronic Resource
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