Publication Date:
2019-07-13
Description:
The applicability of the photon catalysis technique for effecting composition analysis of silicon samples is discussed. A detector for the impurities Al, Cr, Fe, Mn, Ti, V, Mo and Zr is evaluated. During the first reporting period Al, Cr, Fe, and Mn were detected with the photon catalysis method. The best fluorescence lines to monitor and determine initial sensitivities to each of these elements by atomic absorption calibration were established. In the course of these tests vapor pressure curves for these four pure substances were also mapped. Ti and Si were detected. The best lines to monitor were catalogued and vapor pressure curves were determined. Attempts to detect vanadium were unsuccessful due to the refractory nature of this element and the limited temperature range of the evaporator.
Keywords:
ENERGY PRODUCTION AND CONVERSION
Type:
NASA-CR-158598
,
DOE/JPL-955201-78/1
,
JPL-9950-49
,
QR-2
Format:
application/pdf
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