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  • 1
    Publication Date: 2016-06-07
    Description: The effects of heat generation were determined in NiCd cells during high temperature storage on open circuits. The testing was designed to determine the extent to which thermal stability is a valid concern, at temperature of exposure (externally effected) between 40 and 120 C.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1985 Goddard Space Flight Center Battery Workshop (date); p 195 - 214
    Format: application/pdf
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  • 2
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    In:  Other Sources
    Publication Date: 2016-06-07
    Description: An accelerated battery test with 15 periods of cell reversals during reconditioning was performed. The nature and extent of hydrogen generation was examined, and the effects of reversals on battery performance were determined.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Goddard Space Flight Center The 1981 GSFC Battery Workshop; p 271-284
    Format: text
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  • 3
    Publication Date: 2019-06-28
    Description: A user oriented computer program for the analysis of single-ended Schottky diode mixers is described. The program is used to compute the performance of a 140 to 220 GHz mixer and excellent agreement with measurements at 150 and 180 GHz is obtained. A sensitivity analysis indicates the importance of various diode and mount characteristics on the mixer performance. A computer program for the analysis of varactor diode multipliers is described. The diode operates in either the reverse biased varactor mode or with substantial forward current flow where the conversion mechanism is predominantly resistive. A description and analysis of a new H-plane rectangular waveguide transformer is reported. The transformer is made quickly and easily in split-block waveguide using a standard slitting saw. It is particularly suited for use in the millimeter-wave band, replacing conventional electroformed stepped transformers. A theoretical analysis of the transformer is given and good agreement is obtained with measurements made at X-band.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA-TP-2287 , NAS 1.60:2287
    Format: application/pdf
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