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  • ELECTRONICS AND ELECTRICAL ENGINEERING  (2)
  • Chemistry  (1)
  • Nutrients  (1)
  • 1975-1979  (4)
  • 1
    Electronic Resource
    Electronic Resource
    Preliminary observations on nitrogen transport during summer in a small spring-fed Ontario stream (1976)
    Springer
    Hydrobiologia 49 (1976), S. 59-63 
    Details
    ISSN: 1573-5117
    Keywords: Streams ; Nitrogen ; Nutrients ; Denitrification
    Source: Springer Online Journal Archives 1860-2000
    Topics: Biology
    Notes: Abstract Nitrogen transport in a 2 km-long, spring-fed stream was studied during the summer months by analyzing weekly water samples from four stations. The water at the spring had a consistently high level of nitrate-N ranging from about 7 mg/l in late spring to about 3 mg/l in early fall. However, over the length of the stream, 60% (about 97 kg) of the incoming nitrate-N is lost from the water during the summer period. The loss, which does not appear to be attributable to the uptake by aquatic macrophytes or to immobilization, is thought to result from denitrification.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00016169
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    Paper (German National Licenses)
    Fulltext
  • 2
    Electronic Resource
    Electronic Resource
    Estimation of nitrogen-15 levels in derivatized amino acids using gas chromatography quadrupole mass spectrometry with chemical ionization and selected ion monitoringAbbreviation: HFBA = heptafluorobutyric anhydride. (1978)
    Chichester : Wiley-Blackwell
    Biological Mass Spectrometry 5 (1978), S. 648-653 
    Details
    ISSN: 0306-042X
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology
    Notes: The data indicate that a commercial, low resolution mass spectrometer can be used with chemical ionization and selected ion monitoring, without a data system, to estimate nitrogen-15 isotopic enrichment with a sensitivity and precision adequate for many biological studies. This was demonstrated using derivatized amino acid mixtures with separation and direct introduction into the mass spectrometer via a gas chromatograph. The method can discriminate between mean levels separated by 0.1 atom % 15N with 68% confidence at the 0.1 nmol level. Labeled dansylamide samples, inserted by probe, were also measured for 15N content.
    Additional Material: 3 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/bms.1200051203
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    Paper (German National Licenses)
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  • 3
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    Unknown
    Charge distributions near metal-dielectric interfaces before and after dielectric surface flashover (1977)
    In:  CASI
    Details
    Publication Date: 2016-06-07
    Description: A technique was developed for measuring surface charge distribution near interfaces without placing any measuring apparatus near the face of the samples. The results of measurements which were made on FEP Teflon and Kapton dielectrics, before and after are given flashover, with various types of interfaces. Also given are data showing mean time between flashovers for various configurations exposed to a variety of environmental conditions. Several charge transfer mechanisms are considered as a means by which stable charge distributions may be maintained near interfaces.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Lewis Res. Center Proc. of the Spacecraft Charging-Technol. Conf.; p 503-717
    Format: application/pdf
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    NASA TECHNICAL REPORTS
  • 4
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    Surface charge kinetics near metal-dielectric interfaces exposed to kilovolt electron flux (1977)
    In:  CASI
    Details
    Publication Date: 2019-06-27
    Description: Interfaces between dielectric films and grounded metallic boundaries were exposed, in vacuum, to monoenergic electron fluxes having energies up to 22 keV. Two principal concerns were the measuring of the charge distributions on dielectrics and the determining of causes of flashovers, events where dielectric surface charges abruptly transfer to the metallic structures. Surface charges are perturbed within 10 mm of interfaces. Perturbations are relatively small except within about 3 mm of the interface. The probability of flashover was found to be related to microscopic imperfections in the interfaces. As flashovers occur in an exposed metal substrate, points become burned into the dielectric along the slit. As these points develop, the probability of flashover increases greatly. An interface which is highly immune to flashover was formed by covering a dielectric film with a 1.5-mm-thick aperture plate which exposes the film through a machined opening.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA-CR-155195
    Format: application/pdf
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    NASA TECHNICAL REPORTS
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