ALBERT

All Library Books, journals and Electronic Records Telegrafenberg

X
feed icon rss

Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
  • 1
    facet.materialart.
    Unknown
    Measuring Small Changes In Aim Of An Instrument (1993)
    In:  Other Sources
    Details
    Publication Date: 2019-07-12
    Description: Optoelectronic system measures small changes in direction of line of sight of instrument. Optical point source and lens mounted on x-ray telescope in reverse configuration - as projector. Magnified relative lateral motion of point source and lens imaged on position-sensing photodetector.
    Keywords: ELECTRONIC SYSTEMS
    Type: MFS-28663 , NASA Tech Briefs (ISSN 0145-319X); 17; 2; P. 57
    Format: text
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    NASA TECHNICAL REPORTS
Close ⊗
This website uses cookies and the analysis tool Matomo. More information can be found here...