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  • 1
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    Unknown
    Power-MOSFET Voltage Regulator (1982)
    In:  Other Sources
    Details
    Publication Date: 2019-06-28
    Description: Ninety-six parallel MOSFET devices with two-stage feedback circuit form a high-current dc voltage regulator that also acts as fully-on solid-state switch when fuel-cell out-put falls below regulated voltage. Ripple voltage is less than 20 mV, transient recovery time is less than 50 ms. Parallel MOSFET's act as high-current dc regulator and switch. Regulator can be used wherever large direct currents must be controlled. Can be applied to inverters, industrial furnaces photovoltaic solar generators, dc motors, and electric autos.
    Keywords: ELECTRONIC COMPONENTS AND CIRCUITS
    Type: MSC-20059 , NASA Tech Briefs (ISSN 0145-319X); 6; 3; P. 256
    Format: text
    Location Call Number Expected Availability
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    NASA TECHNICAL REPORTS
  • 2
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    Unknown
    Arc-Free High-Power dc Switch (1982)
    In:  Other Sources
    Details
    Publication Date: 2019-06-28
    Description: Hybrid switch allows high-power direct current to be turned on and off without arcing or erosion. Switch consists of bank of transistors in parallel with mechanical contacts. Transistor bank makes and breaks switched circuit; contacts carry current only during steady-state "on" condition. Designed for Space Shuttle orbiter, hybrid switch can be used also in high-power control circuits in aircraft, electric autos, industrial furnaces, and solar-cell arrays.
    Keywords: ELECTRONIC COMPONENTS AND CIRCUITS
    Type: MSC-20091 , NASA Tech Briefs (ISSN 0145-319X); 6; 3; P. 255
    Format: text
    Location Call Number Expected Availability
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    NASA TECHNICAL REPORTS
  • 3
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    11-Line to 512-line decoder (1980)
    In:  Other Sources
    Details
    Publication Date: 2019-06-28
    Description: CMOS decoder is assembled from standard 4-line to 16-line decoder/demultiplexer IC's. Matrix may also be used to generate 256 latched-on or latched-off logic signals instead of 512 discrete unlatched signals. By using conventional CMOS IC's, circuit consumes only about 30 milliwatts.
    Keywords: ELECTRONIC COMPONENTS AND CIRCUITS
    Type: MSC-19751 , NASA Tech Briefs (ISSN 0145-319X); 5; 2; P. 141
    Format: text
    Location Call Number Expected Availability
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    NASA TECHNICAL REPORTS
  • 4
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    Photocapacitive image converter (1980)
    In:  Other Sources
    Details
    Publication Date: 2019-06-28
    Description: Solid-state converters yield high sensitivity at high information-retrieval speed. Main advantages are high sensitivity of photocapacitive mechanism and inherent speed of information retrieval method. Fabrication of both devices is relatively simple and inexpensive.
    Keywords: ELECTRONIC COMPONENTS AND CIRCUITS
    Type: LAR-12513 , NASA Tech Briefs (ISSN 0145-319X); 5; 1; P. 11
    Format: text
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    NASA TECHNICAL REPORTS
  • 5
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    Photocapacitive infrared detector and solar cell (1979)
    In:  Other Sources
    Details
    Publication Date: 2019-06-28
    Description: Lightly doped semiconductor device, with transparent insulating layer based on capacitive response to radiant energy, exhibits excellent sensitivities at room temperature.
    Keywords: ELECTRONIC COMPONENTS AND CIRCUITS
    Type: LAR-12345 , NASA Tech Briefs (ISSN 0145-319X); 4; 2; P. 174
    Format: text
    Location Call Number Expected Availability
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    NASA TECHNICAL REPORTS
  • 6
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    Improved insulator layer for MIS devices (1980)
    In:  Other Sources
    Details
    Publication Date: 2019-06-28
    Description: Insulating layer of supersonic conductor such as LaF sub 3 has been shown able to impart improved electrical properties to photoconductive detectors and promises to improve other metal/insulator/semiconductor (MIS) devices, e.g., MOSFET and integrated circuits.
    Keywords: ELECTRONIC COMPONENTS AND CIRCUITS
    Type: LAR-12455 , NASA Tech Briefs (ISSN 0145-319X); 4; 3; P. 327
    Format: text
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    NASA TECHNICAL REPORTS
  • 7
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    An electronic circuit for sensing malfunctions in test instrumentation (1969)
    In:  CASI
    Details
    Publication Date: 2019-06-27
    Description: Monitoring device differentiates between malfunctions occurring in the system undergoing test and malfunctions within the test instrumentation itself. Electronic circuits in the monitor use transistors to commutate silicon controlled rectifiers by removing the drive voltage, display circuits are then used to monitor multiple discrete lines.
    Keywords: ELECTRONIC COMPONENTS AND CIRCUITS
    Type: KSC-10209
    Format: application/pdf
    Location Call Number Expected Availability
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    NASA TECHNICAL REPORTS
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