Publication Date:
2019-06-27
Description:
Emf comparing device nondestructively inspects metals and alloys for conformance to a chemical specification. It uses the Seebeck effect to measure the difference in emf produced by the junction of a hot probe and the junction of a cold contact on the surface of an unknown metal.
Keywords:
ELECTRONIC COMPONENTS AND CIRCUITS
Type:
ARG-235
Format:
application/pdf
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