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  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Il nuovo cimento della Società Italiana di Fisica 12 (1990), S. 1593-1601 
    ISSN: 0392-6737
    Keywords: Defects in crystals
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Summary Germanium, arsenic and krypton ions of 600 keV energy were implanted in 〈100〉 silicon substrate at 250°C. The hot implantation results in the formation of extended defects (dislocation loops and cluster of point defects) as residual damage. Rapid thermal annealing process at a temperature above 1000°C was used to remove the damage. Rutherford-backscattering channelling technique was used to measure the amount of defects and their annealing. In some cases the channelling results were correlated to transmission electron microscopy (TEM) analysis. The annealing process of the damage is governed by an activation energy of (4.4±0.2) eV for both germanium and arsenic implants. During RTA processes broadening of the As and Ge distributions is quite negligible. The Kr atoms interact instead with defects and the annealing even after a prolonged time at 1100°C is not complete, bubbles surrounded by extended defects are left
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Springer
    Applied physics 20 (1979), S. 353-356 
    ISSN: 1432-0630
    Keywords: 61.70 ; 61.80
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract The effects of single-pulse ruby laser irradiation have been investigated in Si samples with disorder layers located at a depth of 2000 Å from the crystal surface and extending up to 8000 Å. This disorder was obtained by implantation with 350 keV N+ to a fluence of 2×1016/cm2. Channeling, diffraction and transmission electron microscopy were used to characterize the structure of the irradiated layers. After 1.5 J/cm2 irradiation the damaged layer reorders partially, while for about 2.0J/cm2 the surface single crystal becomes polycrystalline. At a higher energy density all the material undergoes the transition to single crystal. Calculations based on the liquid model accounts in part for the experimental results.
    Type of Medium: Electronic Resource
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