Publication Date:
2015-01-08
Description:
Author(s): Yi Cui, Sergio Tosoni, Wolf-Dieter Schneider, Gianfranco Pacchioni, Niklas Nilius, and Hans-Joachim Freund Scanning tunneling microscopy has developed into a powerful tool for the characterization of conductive surfaces, for which the overlap of tip and sample wave functions determines the image contrast. On insulating layers, as the CaO thin film grown on Mo(001) investigated here, direct overlap betwee... [Phys. Rev. Lett. 114, 016804] Published Wed Jan 07, 2015
Keywords:
Condensed Matter: Electronic Properties, etc.
Print ISSN:
0031-9007
Electronic ISSN:
1079-7114
Topics:
Physics
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