Publication Date:
2016-04-29
Description:
Author(s): Xiang-Bing Li, Wen-Kai Huang, Yang-Yang Lv, Kai-Wen Zhang, Chao-Long Yang, Bin-Bin Zhang, Y. B. Chen, Shu-Hua Yao, Jian Zhou, Ming-Hui Lu, Li Sheng, Shao-Chun Li, Jin-Feng Jia, Qi-Kun Xue, Yan-Feng Chen, and Ding-Yu Xing We report an atomic-scale characterization of ZrTe 5 by using scanning tunneling microscopy. We observe a bulk band gap of ∼ 80 meV with topological edge states at the step edge and, thus, demonstrate that ZrTe 5 is a two-dimensional topological insulator. We also find that an applied magnetic field i… [Phys. Rev. Lett. 116, 176803] Published Thu Apr 28, 2016
Keywords:
Condensed Matter: Electronic Properties, etc.
Print ISSN:
0031-9007
Electronic ISSN:
1079-7114
Topics:
Physics
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