Publication Date:
2011-07-28
Description:
Author(s): Sunghun Kim, M. Ye, K. Kuroda, Y. Yamada, E. E. Krasovskii, E. V. Chulkov, K. Miyamoto, M. Nakatake, T. Okuda, Y. Ueda, K. Shimada, H. Namatame, M. Taniguchi, and A. Kimura We have performed scanning tunneling microscopy and differential tunneling conductance ( d I / d V ) mapping for the surface of the three-dimensional topological insulator Bi 2 Se 3 . The fast Fourier transformation applied to the d I / d V image shows an electron interference pattern near Dirac node despite the ... [Phys. Rev. Lett. 107, 056803] Published Wed Jul 27, 2011
Keywords:
Condensed Matter: Electronic Properties, etc.
Print ISSN:
0031-9007
Electronic ISSN:
1079-7114
Topics:
Physics
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