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  • COMPUTER SYSTEMS  (1)
  • Complex dielectric constant  (1)
  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Annals of biomedical engineering 20 (1992), S. 289-305 
    ISSN: 1573-9686
    Keywords: Impedance ; Immittance ; Complex dielectric constant ; Complex modulus
    Source: Springer Online Journal Archives 1860-2000
    Topics: Medicine , Technology
    Notes: Abstract Impedance spectroscopy (IS) is a general term that subsumes the small-signal measurement of the linear electrical response of a material of interest (including electrode effects) and the subsequent analysis of the response to yield useful information about the physicochemical properties of the system. Analysis is generally carried out in the frequency domain, although measurements are sometimes made in the time domain and then Fourier transformed to the frequency domain. IS is by no means limited to the measurement and analysis of data at the impedance level (e.g., impedance vs. frequency) but may involve any of the four basic immittance levels: thus, most generally, IS stands for immittance spectroscopy.
    Type of Medium: Electronic Resource
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  • 2
    Publication Date: 2013-08-31
    Description: The concept of using Parallel Distributed Processing (PDP) to enhance automated experiment monitoring and control is explored. Recent very large scale integration (VLSI) advances have made such applications an achievable goal. The PDP machine has demonstrated the ability to automatically organize stored information, handle unfamiliar and contradictory input data and perform the actions necessary. The PDP machine has demonstrated that it can perform inference and knowledge operations with greater speed and flexibility and at lower cost than traditional architectures. In applications where the rule set governing an expert system's decisions is difficult to formulate, PDP can be used to extract rules by associating the information an expert receives with the actions taken.
    Keywords: COMPUTER SYSTEMS
    Type: NASA. Marshall Space Flight Center, Third Conference on Artificial Intelligence for Space Applications, Part 1; p 171-180
    Format: application/pdf
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