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  • 1
    Electronic Resource
    Electronic Resource
    In situ measurements of the porosity on thin oxide films by IR emission spectrometry (1992)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 18 (1992), S. 571-575 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Observation of the normal spectral emissivity is used as a method of in situ surface investigation. This technique has been used here to follow tungsten oxidation during reactions performed under 1.3 Pa of oxygen both above and below the temperature of the phase transition: ortho-rhombic αWO3 → tetragonal α′WO3.We show that the difference between the observed radiative behaviour is due to the difference between the morphology of these oxides (αWO3 is homogeneous and α'WO3 is porous).From this difference, with an optical model using an effective medium theory (Bruggeman equation), we show that it is possible to describe correctly the experimental measures and to calculate the value of the porosity of the film during its growth. In this model, we show that the best value of the depolarization factor for the oxide particles is 1/3. This is precisely the value that characterizes a porous deposit where the particles (here, oxide particles) are spherical; it is also a good approximation for particles deprived of a particular shape (geometrically isotropic) and disposed at random, such as what we have effectively observed by scanning electron microscopy.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740180720
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  • 2
    Electronic Resource
    Electronic Resource
    First steps of the Ni-20 Cr alloy oxidation studied by Auger electron microprobePaper presented at ECASIA 91, 14-18 October 1991, Budapest, Hungary. (1992)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 18 (1992), S. 789-793 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Polycrystalline Ni-20 Cr alloy ribbons were studied after low-pressure oxidation (3.3 × 10-4 Pa) at 750° C by scanning Auger microanalysis with argon ion sputter profiling. Only chromium oxide is formed under our experimental conditions and a 10% mechanical predeformation (uniaxial deformation) at ambient temperature is found to promote strongly the oxide formation on the alloy surface. In effect, it notably reduces the incubation period that precedes all our oxidations. However, the presented analysis reveals that the chromium oxide distribution is very heterogenous on predeformed oxidized samples at the beginning of the reaction.
    Additional Material: 4 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740181202
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  • 3
    Electronic Resource
    Electronic Resource
    Keramische Filtergeräte für den Laboratoriumsgebrauch (1927)
    Weinheim : Wiley-Blackwell
    Zeitschrift für die chemische Industrie 40 (1927), S. 1585-1586 
    Details
    ISSN: 0044-8249
    Keywords: Chemistry ; General Chemistry
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/ange.19270405208
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  • 4
    Electronic Resource
    Electronic Resource
    Emissivity as a method of thin film analysis (1990)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 16 (1990), S. 25-26 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740160109
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