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  • 1
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 25 (1997), S. 561-568 
    ISSN: 0142-2421
    Keywords: atomic force microscopy ; quasicrystals ; NiAl ; indentation ; crack formation ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Atomic force microscopy (AFM) was used to characterize surface modifications that developed from Vickers indentations into single-crystalline NiAl(100) and single-quasicrystalline AlPdMn (surface of fivefold symmetry). Indenter rotation was used to track the competition between crystal and indenter anisotropy. Distinct differences between the two model substances were found with respect to the lateral extension of the indentation-induced deformation zone, to crack formation, size, shape and radial extension of created structures, and volume balance between the impression and piled-up elevations.© 1997 John Wiley & Sons, Ltd.
    Additional Material: 12 Ill.
    Type of Medium: Electronic Resource
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