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  • 1
    Electronic Resource
    Electronic Resource
    Points to be considered in thermogravimetry (1993)
    Weinheim [u.a.] : Wiley-Blackwell
    Materials and Corrosion/Werkstoffe und Korrosion 44 (1993), S. 345-350 
    Details
    ISSN: 0947-5117
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Description / Table of Contents: Bei der Thermogravimetrie zu berücksichtigende HinweiseKontinuierliche Thermogravimetrie ist eine verbreitete Methode, um Werkstoffe in korrosiven Gasen bei hohen Temperaturen zu prüfen und um Kinetik und Mechanismen der Hochtemperaturkorrosion aufzuklären. Hier werden Empfehlungen zur Durchführung thermogravimetrischer Tests zusammengestellt, Hinweise gegeben betreffend Probengröße und -form, Oberflächenpräparation, Reaktionsrohr, Start des Experiments, besonders empfindliche Messungen und Gasströmung und -regelung. Die Veröffentlichung ist als Grundlage und Startpunkt für zu entwickelnde Richtlinien für die Hochtemperaturkorrosionsforschung gedacht.
    Notes: Continuous thermogravimetry is a common method to test materials in gaseous corrosive environments at high temperatures and to elucidate kinetics and mechanisms of high temperature corrosion. Recommendations how to conduct thermogravimetric tests are collected here, points to be considered including sample size and form, surface preparation, reaction chamber, starting procedure, sensitive measurements, gas supply and dosing. This study is meant as a starting foundation for establishing guidelines in high temperature corrosion research.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/maco.19930440805
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  • 2
    Electronic Resource
    Electronic Resource
    Identification and quantification of Cu contamination on GaAs surfacesPaper presented at QSA 7, Guildford, September 1992. (1994)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 21 (1994), S. 51-55 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Secondary ion mass spectrometry has been used to identify the presence of Cu contamination on undoped semiinsulating GaAs wafer surfaces following polishing under certain conditions. The presence of a contaminating species on the wafer surface is indicated by the influence of pre-etch treatments on electrical measurements performed on heat-treated wafers, with and without Si implants. The identification of Cu as a contaminant is confirmed by photoluminescence measurements. With the appropriate wafer preparation process, the level of Cu contamination is below the SIMS detection limit of 〈1 × 1016 atoms cm-3.In the SIMS analysis of the surface-contaminated wafers, the Cu depth profile shape was dependent on the primary beam bombardment energy, suggesting a chemical segregation of Cu out of the altered layer, a redistribution that is known to occur in Si.To quantify the surface concentration of Cu, GaAs wafers were deliberately contaminated with Cu, heat treated and analysed with glow discharge mass spectrometry and SIMS to provide a cross-calibration.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740210108
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  • 3
    Electronic Resource
    Electronic Resource
    Mass spectra of 2,2′-bridged biphenyls with 12-membered heterocyclic bridging rings: 1 - Some tetrahydrotetrabenzo[b,d,h,j] [1,6]diazacyclododecines and their precursors, 2,2′-diaminobiphenyls (1980)
    Chichester : Wiley-Blackwell
    Biological Mass Spectrometry 15 (1980), S. 526-532 
    Details
    ISSN: 0030-493X
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology
    Notes: Mass spectra of four tetrahydrotetrabenzo[b,d,h,j] [1,6]diazacyclododecines are reported. Loss of phenan-threne gives 2,2′-diaminobiphenyl or the appropriate substituted diamine as the base peak in three cases. Substituents ortho to the biphenyl link substantially modify the fragmentation pattern. Mass spectra of the four 2,2′-diaminobiphenyls have been determined for comparison.
    Additional Material: 4 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/oms.1210151008
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  • 4
    Electronic Resource
    Electronic Resource
    Mass spectra of 2,2′-bridged biphenyls with 12-membered heterocyclic bridging rings: 2 - some tetrabenzo[b, d, h, j][1, 6]diazacyclododecines (1981)
    Chichester : Wiley-Blackwell
    Biological Mass Spectrometry 16 (1981), S. 123-124 
    Details
    ISSN: 0030-493X
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology
    Notes: Mass spectra of four tetrabenzo[b, d, h, j][1, 6]diazacyclododecines are reported. The common pattern of fragmentation is altered by the presence of ortho methoxycarbonyl groups.
    Additional Material: 4 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/oms.1210160305
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  • 5
    Electronic Resource
    Electronic Resource
    Zur Kenntnis des Systems Be3N-Si3N4. V. A Refinement of the Crystal Structure of β-Beryllium Nitride (1969)
    Weinheim : Wiley-Blackwell
    Zeitschrift für anorganische Chemie 369 (1969), S. 108-112 
    Details
    ISSN: 0044-2313
    Keywords: Chemistry ; Inorganic Chemistry
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology
    Description / Table of Contents: Eine erneute Bestimmung der Struktur von β-Be3N2 zeigt, daß alle Berylliumatome tetraedrische Koordination in einer HCHCHC… Folge von Schichten mit dichtest gepackten Sticktoffatomen haben. Zwei der Beryllium-Atomen sind vollständig besetzt, während ein drittes Berylliumatom zwischen zwei Lagen fehlgeordnet ist, die sich gegenseitig ausschließen.
    Notes: A re-examination of the structure of β-Be3N2 has shown that all the beryllium atoms have a tetrahedral coordination in a HCHCHC… layer sequence of close-packed nitrogen atoms. Two of the beryllium atom sites are fully occupied while the third beryllium is disordered between two mutually exclusive tetrahedral sites.
    Additional Material: 2 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/zaac.19693690115
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  • 6
    Electronic Resource
    Electronic Resource
    Quantitative depth profiling by glow discharge mass spectrometryPaper presented at the Quantitative Surface Analysis (QSA-4) Conference, Teddington, UK, November 1986. (1988)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 11 (1988), S. 40-44 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The ability of the VG 9000 glow discharge mass spectrometer to perform highly quantitative materials analysis has led to applications of the instrument in the field of depth profiling. The result has been the emergence of a technique that is capable of performing rapid quantitative depth analysis for a wide range of elements to sub ppm detection limits. Preliminary investigations into depth resolution suggest the capability of resolving nanometre scale structures.Quantitation is achieved by direct ratioing of ion beams to that of the matrix: elemental sensitivity factors, determined from standards, vary by less than an order of magnitude across the periodic table, and are relatively matrix independent, so that high accuracy results may be attained without the need for closely matching standards and matrix. A high resolution double-focusing mass spectrometer affords clear separation of atomic peaks from the majority of the inevitable low level molecular species in the mass spectrum, which would otherwise limit the accuracy of trace element determinations.
    Additional Material: 6 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740110105
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  • 7
    Electronic Resource
    Electronic Resource
    Composition-Depth profiling and interface analysis of surface coatings using ball cratering and the scanning auger microprobePaper presented at the International Conference on Quantitative Surface Analysis, held at the National Physical Laboratory, Teddington, UK, 16-17 October 1979. (1979)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 1 (1979), S. 204-210 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The provision of accurate composition-depth profiles to depths 〉 1 μm is important in the characterization and investigation of thick films, surface coatings, surface treatments and many other technologically important applications. At present, such profiles are usually achieved by sequential ion bombardment and surface analysis and hence involve many difficulties in interpretation due to the non-uniform erosion of surfaces under ion bombardment. In this paper a method of obtaining accurate depth profiles is described using a ball-cratering device. The method employs a rotating ball to fashion a well-defined spherical crater in the sample surface, the depth and width of which can be accurately controlled. The specimen is then cleaned in situ using a scanning ion beam for a short period and the composition-depth profile is obtained either by point-by-point analysis down the sloping sides of the crater wall or by using Auger line-scan techniques across the crater. Coating-substrate interface analysis can also be obtained by sputter-depth profiling at a point on the coating close to the exposed substrate. The method is not only considerably faster than ion etching, but the resulting depth profile also has a well-defined depth resolution. Composition-depth profiles through nitrocarburized mild steel surfaces and protective surface coatings are presented to illustrate the usefulness of the technique.
    Additional Material: 10 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740010607
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