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  • Chemistry  (1)
  • 1985-1989  (1)
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    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 12 (1988), S. 3-10 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Anaytical electron microscopy (AEM) consists of extending the information generally delivered by the electron microscope (topography, structure) with a knowledge of the chemical and electronic properties. Its major advantage is to perform higly sensitive spectroscopies, such as electron energy loss spectroscopy (EELS), on nanovolumes of materials defined and localized within their environment. It is therfore well suited to the study of complex specimens, such as catalytical products, in which there is a competion of bulk and surface properties. Metallic Co particles on supporting CeO2 layers provide an illustrative example of AEM capabilities. Atomic resolution images of surfaces and interfaces are associated with EELS spectroscopy and EELS maps to obtain a detailed view of the local arrangement of the different components, at successive steps of the chemical reaction. Nevertheless, beaminduced chemical tranformations of the system have been observed at the atomic scale. Radiation damage therefore constitutes the final limitation.
    Additional Material: 9 Ill.
    Type of Medium: Electronic Resource
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