Publication Date:
2019-06-28
Description:
The capabilities of and potential problems with ion microprobe analysis are illustrated in the determination of Ni distribution between silicate melt and diopside as a function of concentration. Samples of diopside and a melt in the albite-anorthite-diopside system were doped with Ni to levels of 5.22 and 1.08 wt % and 1060, 138, 42 and 30 ppm, and with 3 ppm of Ni-63, and characterized by both electron and ion microprobe techniques. Measurements of Ni-62 distribution by the ion probe method give a ratio of 1.87 for the ratio of count rates in the diopsides with the glass, which is slightly lower than the value of 2.05 obtained from beta-track mapping. The measurements required the secondary ion signal to be linear with concentration in the range measured, and a calibration to correct for differential secondary ion yields from different phases. It is found, however, that partition coefficients measured for Ni-58 and Ni-60 are not constant with Ni concentration, probably due to Ni migration during crystallization. The results thus show ion microprobe analyses to be feasible for simultaneous measurements of distributions of more than one element, and of elements inappropriate for beta-track mapping or electron probe analysis.
Keywords:
CHEMISTRY AND MATERIALS (GENERAL)
Type:
Geochimica et Cosmochimica Acta; 45; Nov. 198
Format:
text
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