Publication Date:
2012-02-18
Description:
Author(s): N. Camus, B. Fischer, M. Kremer, V. Sharma, A. Rudenko, B. Bergues, M. Kübel, N. G. Johnson, M. F. Kling, T. Pfeifer, J. Ullrich, and R. Moshammer The strong-field induced decay of a doubly excited, transient Coulomb complex Ar ** →Ar 2+ +2e - is explored by tracing correlated two-electron emission in nonsequential double ionization of Ar as a function of the carrier-envelope phase. Using 〈6 fs pulses, electron emission is essentially confined ... [Phys. Rev. Lett. 108, 073003] Published Fri Feb 17, 2012
Keywords:
Atomic, Molecular, and Optical Physics
Print ISSN:
0031-9007
Electronic ISSN:
1079-7114
Topics:
Physics
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