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XeCl laser ablation of yttria stabilized zirconia (1992)

Kokai, F. ; Amano, K. ; Ota, H. ; [et al.]

Springer

Applied physics 54 (1992), S. 340-342

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ISSN: 1432-0630

Keywords: 81.40.−z ; 82.80.Pv

Source: Springer Online Journal Archives 1860-2000

Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics

Notes: Abstract XeCl laser ablation of yttria stabilized zirconia (YSZ) in air and in vacuum (1.3×10−4 Pa) is studied by means of etch depth measurements, scanning electron microscopy, and X-ray photoelectron spectroscopy of ablated surfaces. Results on ablation rate, surface morphology, and surface chemical composition are discussed in terms of the influence of ambient atmosphere on the ablation process, rapid melting and solidification of ablated surfaces, and preferential removal of oxygen atoms from the YSZ surface.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1007/BF00324198

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