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  • 79.20.Rf  (1)
  • 79.60.-i  (1)
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  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Applied physics 45 (1988), S. 63-67 
    ISSN: 1432-0630
    Keywords: 79.20.Nc ; 79.20.Rf
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract Critical angles for shadowing in low-energy ion scattering spectroscopy are calculated in the momentum approximation for the Thomas-Fermi-Molière potential and the Ziegler-Biersack-Littmark potential. In the relevant parameter range the results can be fitted by a formula containing five constants depending on the potential only. For a fixed projectile-target combination at a given energy the distance dependence of the critical angle is described by a simple power law. The comparison of the calculated results with experimental data shows that the inclusion of the effect of thermal vibrations on the critical angles improves the agreement between calculations and experiment significantly.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Springer
    Applied physics 40 (1986), S. 203-207 
    ISSN: 1432-0630
    Keywords: 07.65.Eh ; 79.60.-i
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract The energy resolution of a VUV isochromat spectrometer employing the traditional energy selective Geiger counter can be significantly improved. The variance of the optical resolution function with the usual CaF2 entrance window is (240 meV)2. With SrF2 we obtain (113 meV)2 at room temperature and (73 meV)2 at 70°C. A direct confirmation of these data, which were derived from a moment analysis of the threshold behaviour of an Au isochromat is provided by a measurement of image potential states at Cu(001).
    Type of Medium: Electronic Resource
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