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  • 05.70 Jk  (1)
  • 72.80.Ey  (1)
  • Springer  (2)
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  • Springer  (2)
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  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Applied physics 48 (1989), S. 315-319 
    ISSN: 1432-0630
    Keywords: 72.80.Ey
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract Nominally undoped InP wafers have been annealed in a phosphorus atmosphere under a pressure of about 5 bar at temperatures of 900 °C for about 80 h. It was found that the electrical properties of the samples changed considerably after this treatment. A room temperature resistivity of up to 2×107Ωcm (semi-insulating behaviour) was obtained in the bulk of the samples. The resistivity finally obtained depends on the starting carrier concentration of the untreated samples. The Hall coefficient and Hall mobility have been measured up to 600 °C. The results can be interpreted in terms of a deep electronic level (E A=0.63 ... 0.65 eV below the conduction band). The Hall coefficient was always found to be negative resulting in a Hall mobility of 1.4 to 4.9×103 cm2/Vs. The highest resistivity in nominally undoped bulk InP so far reported in the literature [1] was ϱ=3.6 × 105Ωcm. Therefore, this paper demonstrates for the first time that a really semi-insulating behaviour of ϱ〉107 Ωcm can be achieved for bulk InP with the purity of nominally undoped material (1015 to 1016cm−3).
    Type of Medium: Electronic Resource
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  • 2
    ISSN: 1573-7357
    Keywords: 05.70 Ln ; 05.70 Jk ; 64
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract The surface impedance of two 350nm thick YBCO films was measured for temperatures between 4.2K and 150K in a copper cavity at 87 GHz. Both films, one grown by electron beam evaporation on MgO, the other one by high oxygen-pressure dc sputtering from a stoichiometric target on LaAlO3, provide critical temperatures of about 91K, low residual surface resistances of Rs(4.2K) 〈 1mΩ and low specific resistivities in the normal state of ϱ(100K) 〈 85μΩcm. The experimental data obtained on these two films are compared to a d-wave model of superconductivity which incorporates elastic and inelastic scattering. Good agreement between theory and the experimental results for both the surface resistance and the penetration depth in the whole temperature range is achieved for scattering phase shifts near 0.4π and order parameter amplitudes in the range of 2Δ0(0)/kBTc = 6.0 – 7.5 without subtracting an extrinsic residual surface resistance.
    Type of Medium: Electronic Resource
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