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  • 72.40.Ht  (1)
  • 1985-1989  (1)
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  • 1985-1989  (1)
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    Electronic Resource
    Electronic Resource
    Springer
    Applied physics 40 (1986), S. 177-182 
    ISSN: 1432-0630
    Keywords: 42.65.Jx ; 42.70.Gi ; 72.40.Ht ; 78.20.Jq
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract We report the first experimental measurement of fringe-angle applied electric field scaling of space charge growth and of crystallographic orientation effects in the initial development of the diffraction efficiency of thick holograms produced by the photorefractive effect in a bismuth silicon oxide (BSO) crystal. Diffraction efficiencies of holograms made by interfering two plane waves on the [¯110] face are measured as a function of the angle between the fringe pattern and the applied electric field. As the crystal is rotated relative to the interference fringes, the applied field may be scaled to yield identical space charge growth. Polarization-dependent diffraction measurements agree with the theory of a birefringent grating when optical activity is included as a separate, serial effect. Both the rotation-scaled applied electric fields and the crystallographic variations in the birefringent diffraction grating are consistent with charge transport processes in which the initial space charge fields are perpendicular to the interference fringes over growth times extending nearly into the steady state regime.
    Type of Medium: Electronic Resource
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