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  • 1
    ISSN: 1432-0630
    Keywords: 72.20 ; 72.80 ; 78.65
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract Fine-grained (d≈0.1 μm), polycrytalline SiC films were prepared on top of insulating and optically transparent sapphire substrates by means of a thermal crystallization technique. Optical absorption measurements indicate that the individual SiC grains consist of relatively defect-free β-SiC surrounded by high-defect density grain-boundary material. Nominally undoped material exhibits a low de conductivity (δ≈10−8 Ω−1 cm−1) in the dark and an efficient photoconductivity apon illumination with short-wavelength UV light. The temperature dependence of the de transport exhibits a quasi-Arrhenius-type behaviour with average activation energies of the order to 0.6 eV. A characteristic feature of this kind of transport is a continuous increase in activation energy with increasing film temperature. Upon doping with N, P and Al ions, the average activation energy is decreased and room temperature conductivities of the order of 0.1 Ω−1 cm−1 are reached. Doping with B ions, on the other hand, only leads to high-resistivity material. It is shown that the electronic transport in doped SiC-On-Sapphire (SiCOS) films can be successfully modelled in terms of a grain-boundary-dominated conduction process. In this process thermal activation across potential barriers at the grain-boundary surfaces competes with funneling through these same barriers.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 23 (1995), S. 155-162 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A model system was developed to study the influence of the rubber formulation and/or the aging conditions on the adhesion between brass and rubber. The bonding compounds were vulcanized on thin, homogeneous brass layers that had been prepared by sputtering onto special polymeric substrates; some of these compounds were steam-aged under controlled conditions subsequently. After the separation of the polymeric film, combined analytical electron microscopy (transmission electron microscopy/energy dispersive spectroscopy; TEM/EDS) and sputter neutral mass spectrometry (SNMS) analyses were performed. While the TEM/EDS studies offer a detailed insight into the morphological structure of the interphase, the SNMS depth profiles allow a rapid and reliable differentiation between various rubber formulations. With these model samples the beneficial effect of boric acid esters on the adhesion of cobalt-containing bonding compounds, which is observed in a typical short-term adhesion test after steam-aging, can be explained: boric acid esters act with cobalt salts as corrosion inhibitors for brass, preventing the growth of a thick intermediate ZnO/Zn (OH)2 layer that is the starting point for delaminations.
    Additional Material: 7 Ill.
    Type of Medium: Electronic Resource
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