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  • 71.20  (2)
  • 79.20.Nc  (1)
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  • 1
    Electronic Resource
    Electronic Resource
    Deconvolution of appearance potential spectra II (1979)
    Springer
    Applied physics 20 (1979), S. 299-303 
    Details
    ISSN: 1432-0630
    Keywords: 71.20
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract We have recently introduced a new method for the inversion of autoconvolution integrals [1]. In this paper, we describe an improvement of the previous algorithm which results from the consequent use of cubical spline functions. The treatment given here is mathematically more consistent and offers better numerical stability than that given earlier. The method is applied to the deconvolution of the rather narrow NiL III appearance potential line. Problems of stability and error propagation are discussed in some detail.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00895000
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Isochromat spectroscopy using SXAPS equipment (1979)
    Springer
    Applied physics 20 (1979), S. 37-40 
    Details
    ISSN: 1432-0630
    Keywords: 71.20
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract Any conventional soft x-ray appearance potential spectrometer may be converted to an isochromat spectrometer by placing an absorber foil of suitably chosen thickness in front of the x-ray detector. In the present work, we demonstrate the principle and work out in detail the properties of an aluminum absorption foil. Isochromats of a hafnium sample are compared to results obtained with a crystal x-ray spectrometer. Also, the equivalence of an isochromat and an SXAPS measurement at the same energy will be shown. The densities of unoccupied states as derived from the respective experiments are in pretty good agreement.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00901784
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  • 3
    Electronic Resource
    Electronic Resource
    The determination of shadowing critical angles in impact collision ion scattering spectroscopy (1988)
    Springer
    Applied physics 45 (1988), S. 63-67 
    Details
    ISSN: 1432-0630
    Keywords: 79.20.Nc ; 79.20.Rf
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract Critical angles for shadowing in low-energy ion scattering spectroscopy are calculated in the momentum approximation for the Thomas-Fermi-Molière potential and the Ziegler-Biersack-Littmark potential. In the relevant parameter range the results can be fitted by a formula containing five constants depending on the potential only. For a fixed projectile-target combination at a given energy the distance dependence of the critical angle is described by a simple power law. The comparison of the calculated results with experimental data shows that the inclusion of the effect of thermal vibrations on the critical angles improves the agreement between calculations and experiment significantly.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00618764
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