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  • 42.65.Ky  (2)
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  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Applied physics 63 (1996), S. 541-544 
    ISSN: 1432-0649
    Keywords: 42.65.Ky ; 78.47.+p ; 63.20.Kr
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract Femtosecond pump-probe second-harmonic generation (SHG) and transient linear reflectivity measurements were carried out on polycrystalline Cu, Ag and An in air to analyze whether the electron temperature affects Fresnel factors or nonlinear susceptibilities, or both. Sensitivity to electron temperatures was attained by using photon energies near the interband transition threshold. We find that the nonlinear susceptibility carries the electron temperature dependence in case of Ag and Au, while for Cu the dependence is in the Fresnel factors. This contrasting behavior emphasizes that SHG is nota priori sensitive to electron dynamics at surfaces or interfaces, notwithstanding its cause.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Springer
    Applied physics 60 (1995), S. 203-208 
    ISSN: 1432-0630
    Keywords: 42.65.Ky ; 75.30.Pd
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract The influence of surface magnetization of polycrystalline nickel samples on Second-Harmonic Generation (SHG) in reflection was investigated using pleosecond laser pulses of 600 nm. The effect was measured for different polarization combinations with samples under normal conditions. For the azimuthal rotation of the magnetization anisotropies of (13±2)% and (19±3)% were observed for s→P and p→P polarization, respectively. The Kerr angle observed by. SHG was found to be an order of magnitude larger (4±1)o than the linear Kerr angle. A hysteresis curve was recorded for p→P polarization. No influence of the oxide layer was noticed.
    Type of Medium: Electronic Resource
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