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  • 42.65.−k  (1)
  • 65N15  (1)
  • Springer  (2)
  • American Physical Society (APS)
  • 1990-1994  (2)
Collection
Publisher
  • Springer  (2)
  • American Physical Society (APS)
Years
  • 1990-1994  (2)
Year
  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Computing 51 (1993), S. 111-123 
    ISSN: 1436-5057
    Keywords: 65N30 ; 65N15 ; 65L10 ; Least-squares ; mixed finite element method ; superconvergence
    Source: Springer Online Journal Archives 1860-2000
    Topics: Computer Science
    Description / Table of Contents: Zusammenfassung Die Methode der kleinsten Fehlerquadrate wird bei gemischten finiten Elementen für die Differentialgleichungen erster Ordnung angewandt, die den linearen elliptischen 1-D Randwertaufgaben zweiter Ordnung entsprechen. Es werden theoretische Untersuchungen vorgestellt und Fehlerabschätzungen vorgenommen. Diese sind mit den früther von Carey and Shen [5] veröffentlichten numerischen Analysen konsistent. Die LBB Bedingung ist nicht notwendig und es werden Abschätzungen für verschiedene Grade der Austatz-Polynome vorgenommen. Superkonvergente Abschätzungen werden ebenso vorgestellt.
    Notes: Abstract The least-squares finite element method for first order systems corresponding to second order linear two-point boundary value problems is considered. A theoretical analysis and error estimates are developed and the estimates are seen to be consistent with our previous numerical studies in Carey and Shen [5]. The method is not subject to the LBB condition and we consider, in particular, the estimates when the polynomial degree differs for the corresponding variables. Superconvergence estimates are also developed.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Springer
    Applied physics 59 (1994), S. 541-543 
    ISSN: 1432-0630
    Keywords: 42.65.−k
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract A brief overview on second-harmonic generation and sum-frequency generation as surface analytical tools is given with a discussion on the intrinsic limitations of the techniques often encountered in the applications. The possibly of using nonlinear optical processes for surface studies has attracted increasing attention in recent years. Optical Second-Harmonic Generation (SHG) and Sum-Frequency Generation (SFG), in particular, have been well accepted as viable surface probes [1]. They have many advantages over the conventional techniques. By nature, they are highly surface-specific and has a submonolayer sensitivity. As coherent optical processes, they are capable of in-situ probing of surface in hostile environment as well as applicable to all interfaces accessible by light. With ultrafast pump-laser pulses, they can be employed to study surface-dynamic processes with a subpicosecond time resolution. These advantages have opened the door to many exciting research opportunities in surface science and technology. This paper gives a brief overview of this fast-growing new area of research.
    Type of Medium: Electronic Resource
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