ALBERT

All Library Books, journals and Electronic Records Telegrafenberg

feed icon rss

Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
  • 1
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 26 (1998), S. 188-194 
    ISSN: 0142-2421
    Keywords: SIMS ; secondary ion mass spectrometry ; imaging ; 3D ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Three-dimensional (3D) SIMS images of secondary ion distributions in a solid volume can be produced from a stack of individual images acquired sequentially at different depths during depth profiling of the solid. While it is often possible to obtain visual correlations of large-scale features that occur in several images in the stack, the correlation of less-obvious features requires a more mathematical approach. We present here two cases where image cross-correlation spectroscopy (ICCS) can be used to clarify the presence or absence of organized structure in a 3D depth profile. In one example, the images of deuterium distribution in a zirconium oxide thin film were confirmed to exhibit order over a series of images, thereby suggesting the existence of continuous pores in the material. In a second example, the apparent clustering of gold distributions in a 3D profile of an arsenopyrite mineral was shown to be uncorrelated and likely an artefact of data collection. © 1998 John Wiley & Sons, Ltd.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
Close ⊗
This website uses cookies and the analysis tool Matomo. More information can be found here...