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  • 07.75+h  (1)
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    Electronic Resource
    Electronic Resource
    Springer
    Applied physics 37 (1985), S. 115-135 
    ISSN: 1432-0649
    Keywords: 52.70-m ; 52.75.Kq ; 52.80.Mg ; 07.75+h
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract Today, SF6 is used to a great extent as insulating and arc-quenching medium in high-voltage gas-blast circuit breakers. The arcing in SF6 during current interruption forms decomposition products. These can influence the arc-quenching properties of the circuit breaker. Furthermore, they can cause corrosion of the circuit breaker housing. In this comprehensive study we present results obtained for the first time from a direct mass spectrometric investigation of the exhaust gases of a high pressure SF6 arc in a model circuit breaker. Our mass spectrometric system consists of a time-of-flight mass spectrometer (TOFMS) equipped with a molecular beam sampling systems. This device allows us to measure mass spectra of high pressure sources with a time resolution of up to 10,000 spectra per second. We have determined the formation rate of the most abundant decomposition products in a SF6 arc at 1 bar. These products are SF4, CF4, WF6, SOF2, SO2, CS2 S2F2 and HF. The fast detection time inherent to our system permits also the determination of the formation of SF4, which is 0.45–0.50 Vol. %/(kJ/1SF6). In addition, we have studied the influence of water and oxygen impurities which are responsible for the production of highly corrosive HF. Finally, we have considered the influence of the thermal degradation of teflon (P.T.F.E.), which is used as nozzle and insulating material in circuit breakers. On this occasion we have demonstrated that CF4, which exhibits dielectric properties similar to SF6, is the main decomposition product formed from teflon. However, we have found that besides CF4 also excess carbon is formed, which is deposited on insulators of the model circuit breaker. Our time-resolved mass spectra reveal that the CF4 production from teflon is delayed by a few milliseconds with respect to the SF6 dissociation in the arc. This delay can influence the interrupting process of the circuit breaker by changing the plasma composition during the arcing period. Although our experiments have been performed on a model circuit breaker we claim that the results presented in this study can be applied to real circuit breakers, since the arc current density and the energy dissipated per liter SF6 are of the same order of magnitude in both devices.
    Type of Medium: Electronic Resource
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