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  • 1
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 8 (1979), S. 11-13 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: An X-ray fluorescence method for the measurement of film and coating thickness has been described for use in situations where standard foils of the same material are not available for comparison. The method is based on the measurement of combined mass absorption coefficient of the coating element at the excitation and at the fluorescent energies using thin samples of a compound in which the coating element is present and then calculating the coating thickness using the fluorescence equation. The paper describes the theoretical approach and presents the result of the measurement of certain film and coating thicknesses which support the theoretical considerations.
    Additional Material: 1 Ill.
    Type of Medium: Electronic Resource
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