Springer Online Journal Archives 1860-2000
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Abstract Magnetic-structure analysis by means of spin-polarization analysis of the secondary electrons in a scanning electron microscope-type (SEM) experiment is demonstrated, using the LEED spin-polarization detector. The advantages in size, handling ability and efficiency, relevant for SEM operation, are pointed out. Limitations and future development are discussed.
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