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  • 1
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 22 (1994), S. 75-78 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: We have developed a novel cylindrical mirror Auger electron analyzer with the well defined electric field of 0.1% and the residual magnetic field of less than 1 mG. The CMA has a coaxial electron gun and the entrance angles are 42.3° ± 6°. The theoretically calculated energy resolution of 0.24% was obtained and the transmission was estimated to be 5.6%. This CMA can be used to obtain an absolute Auger electron yield with errors in peak heights of 5%, with an uncertainty in the energy position of 0.1 eV (or 0.01%), and with ghost intensities due to scattering of 0.1-0.2% for energies greater than 10 eV. Samples of polycrystalline gold, silver, and copper have been examined.
    Additional Material: 12 Ill.
    Type of Medium: Electronic Resource
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  • 2
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: In Auger electron spectroscopy, the relative sensitivities of elements, which are widely used in quantitative analysis, are primarily obtained by measurement. Nevertheless, it is very tedious to collect all relative elemental sensitivity factors for different primary electron beam energies. In view of this, we have examined methods of deriving the relative sensitivity factor for an arbitrary electron beam energy from one experimental value determined at a set energy. For this calculation, we have to consider the contributions of the ionization cross-section and the electron backscattering factor. Several formulas for the ionization cross-section and the backscattering correction factor have been reported. We have performed experiments to examine their correction accuracy. It was found that when Gryziński's formula is used as the ionization cross-section and Love-Scott's formula as the backscattering correction factor, the difference between calculated sensitivity values and measured values was found to be 〈15% for excitation energies of 〈20 keV.
    Additional Material: 8 Ill.
    Type of Medium: Electronic Resource
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