Publication Date:
2013-11-10
Description:
Article Charge-trapping memory offers many advantages over existing data storage media, though the spatial distribution of charge remains elusive. Here Yao et al . use electron holography to map its distribution in high-κ dielectric stacks under different applied bias. Nature Communications doi: 10.1038/ncomms3764 Authors: Y. Yao, C. Li, Z. L. Huo, M. Liu, C. X. Zhu, C. Z. Gu, X. F. Duan, Y. G. Wang, L. Gu, R. C. Yu
Electronic ISSN:
2041-1723
Topics:
Biology
,
Chemistry and Pharmacology
,
Natural Sciences in General
,
Physics
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