ISSN:
1573-482X
Source:
Springer Online Journal Archives 1860-2000
Topics:
Electrical Engineering, Measurement and Control Technology
,
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
Abstract Polycrystalline layers of the alloy CdSe0.9Te0.1 were prepared from compacted plates of CdSe-CdTe-Cr2O3 powders. By sintering these plates in a temperature gradient, sublimation of CdSe and CdTe occurs which finally leads to crystallization of a CdSeTe alloy layer on the remaining Cr2O3 particles. Extensive characterization of the layers has been performed using X-ray diffraction, SEM observations, photoconductivity and photoluminescence measurements. A grain size up to 40 μm has been obtained with some preferential micro-crystalline orientation along the c-axis of the wurtzite structure. Relative photoconductivity approaching 106 under 500 Lx illumination has been measured, which demonstrates the high photosensitivity of this material grown in the presence of α chromium tri-oxide.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1023/A:1008970524922
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