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Specific field emission properties of thin palladium films (1976)

Stark, D. ; Zwicknagl, P.

Springer

Applied physics 10 (1976), S. 265-268

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ISSN: 1432-0630

Keywords: 79.40 ; 73

Source: Springer Online Journal Archives 1860-2000

Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics

Notes: Abstract The field emission current from thin palladium films deposited on insulating tips in UHV was measured as a function of film thickness at relatively low field strengths. The observed periodic oscillations of the field emission current can be interpreted as the quantum size effect.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1007/BF00897226

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