ISSN:
1600-5724
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Chemistry and Pharmacology
,
Geosciences
,
Physics
Notes:
The real part, f' of the anomalous dispersion correction to atomic structure factors was measured by using Pendellösung fringes for Si 220 and {\bar 22}0 reflections in the wavelength range from Cu Kα1 to Rh Kα1. In order to avoid ambiguity in the Thomson-scattering term due to the nature of the bonding, the quantity (f'X - f'Ag) was compared with the available theoretical calculations. In this expression, f'X and f'Ag are the corrections for radiation X and Ag Kα1, which is used as the standard, respectively. The present experimental results fit best the values calculated by Cromer & Liberman [J. Chem. Phys. (1970), 53, 1891-1898].
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S056773947800008X
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