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  • 1
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: YBa2Cu3O7 (YBCO) thin films with c-axis orientation on (001) SrTiO3, (001) MgO and (110) NdGaO3 substrates were examined by four-circle diffractometry with Co Kα and synchrotron radiation (λ = 0.1540 nm) using the q-scan technique. Small local film rotations about [001] have been introduced by two different mechanisms: (1) the orthorhombic/tetragonal phase transition driven by iron substitution or changes of the oxygen content; (2) heavy-ion irradiation (1.4 GeV 238U UNILAC, GSI Darmstadt). In the original orthorhombic state, the (110) axes of film and substrate are parallel so that the (100)film axes form an angle of 0.45° to those of the substrate. With decreasing orthorhombicity, this angle decreases to zero for tetragonal symmetry. Irradiation of the orthorhombic film by heavy ions produces detwinning and leads to a macroscopic preferential parallel alignment of the 〈100〉 axes of film and substrate. This reorientation is completed for a dose between 1011 and 1012 particles cm−2. High-resolution transmission electron microscopy investigations reveal a rotation of crystallites in the ab plane of irradiated samples of up to 3°. For irradiation with 200 (456) MeV 40Ca, no detwinning is observed.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 51 (1995), S. 153-158 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: The videographic simulation algorithm has been further developed to enable any distribution or vector correlation among atoms or structure variants beyond the first shell. The simulation method is applied to Ni4Mo, Au4Mn and Cu3Au in order to describe their real structures above Tc. One of the main advantages of the method is the rapid calculation of the diffraction pattern from the simulated videographic structure image (parallel processing). Moreover, the three-dimensional simulation field can be analysed to determine the local atomic arrangement or to calculate short-range-order parameters. The method can generally be applied to simulate defect or vacancy distributions with a specific degree of correlation.
    Type of Medium: Electronic Resource
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