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  • 1
    Electronic Resource
    Electronic Resource
    Protein single-crystal diffraction with 5 Å synchrotron X-rays at the sulfur K-absorption edge (1993)
    Copenhagen : International Union of Crystallography (IUCr)
    Acta crystallographica 49 (1993), S. 308-310 
    Details
    ISSN: 1399-0047
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: . Sulfur atoms, an integral part of many proteins, are possible candidates for anomalous scattering in phase determination by multiple-wavelength methods. The main difficulty encountered is that a wavelength of about 5 Å is required to obtain a large anomalous signal from these atoms, leading to very large absorption effects. Initial experiments have been carried out using a synchrotron X-ray source, evacuated beam tubes, a diffractometer inside a vacuum chamber, a special sample holder and a suitable scattering geometry. The results are encouraging, showing that Bragg reflections can be measured, and that changes in their intensities around the absorption edge are observable.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0907444992011910
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  • 2
    Electronic Resource
    Electronic Resource
    Intralayer Hydrogen Bonding in CdSeO3.H2O (1998)
    Oxford [u.a.] : International Union of Crystallography (IUCr)
    Acta crystallographica 54 (1998), S. 169-171 
    Details
    ISSN: 1600-5759
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0108270197014042
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  • 3
    Electronic Resource
    Electronic Resource
    Time-Resolved X-ray Powder Diffraction Using a Large-Area CCD-Based Detector and Rietveld Refinement: Solid-State Polymerization of S2N2 to (SN)x (1997)
    Chester : International Union of Crystallography (IUCr)
    Journal of synchrotron radiation 4 (1997), S. 83-94 
    Details
    ISSN: 1600-5775
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: A kinetic study of the solid-state polymerization of disulfur dinitride (S2N2) to polysulfur nitride [(SN)x] has been performed, combining monochromatic high-energy (λ = 0.3263 Å) synchrotron radiation X-ray powder diffraction, a large-area (ø = 220 mm) CCD-based X-ray image-intensifier detector and Rietveld refinement. Recently developed techniques for detector calibration and reduction of two-dimensional images to one-dimensional diffraction patterns have been employed for data processing/analysis. Good fits were obtained after Rietveld refinement [Rp = 8.4%, wRp = 9.4%, sin(θmax)/λ = 0.585 Å−1] of diffraction patterns of S2N2 from images with 2 s exposure time. The solid-state polymerization of S2N2 to (SN)x, was followed at a maximum rate of two diffraction images per minute. Scale factors and cell parameters for S2N2 and β-(SN), as functions of time were readily obtained after Rietveld refinement of the diffraction patterns obtained from each individual image throughout the polymerization. The polymerization was preceded by a lattice distortion of S2N2, and at 50% conversion the a axis had decreased by about 1% and the c axis had increased about 1%. The polymerization yielded not only the expected polymer β-(SN)x, but also a small amount of a compound that could be another phase of (SN)x.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0909049597000265
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  • 4
    Electronic Resource
    Electronic Resource
    1,3,4,6-Tetrathiapentalene-2,5-dione (1999)
    Oxford [u.a.] : International Union of Crystallography (IUCr)
    Acta crystallographica 55 (1999), S. 590-592 
    Details
    ISSN: 1600-5759
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0108270198014346
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  • 5
    Electronic Resource
    Electronic Resource
    Anomalous X-ray scattering at the sulfur edge of poly(3-octylthiophene) (1994)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 27 (1994), S. 192-195 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Anomalous X-ray diffraction was performed at the sulfur K edge of the partially crystalline conducting polymer poly(3-octylthiophene) (P3OT). This is the first time anomalous diffraction at the sulfur edge has been used to obtain additional information on the structure of a polymer. A strong wavelength intensity variation of the 100 reflection was observed. This intensity change and the variation of the fluorescent scattered background corroborate excellently with the theory and theoretical intensity calculations confirm previously suggested structural models.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889893009835
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