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  • 1
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 33 (2000), S. 364-371 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: A novel experimental technique that employs high-energy synchrotron radiation is used for the investigation of through-thickness texture gradients in two aluminium plates, cold-rolled 40% with either intermediate or small draughts. In these two plates, crystallographic textures are inspected in a large number of layers. Texture maps of pole densities throughout the sample thickness are presented. A texture of the rolling type is developed through the plate thickness after intermediate draught rolling. Pronounced inhomogeneities associated with the shear texture are observed in the sample rolled with small draughts. For selected layers, direct pole figures are compared with those obtained by traditional low-energy X-ray diffraction and by the electron backscattering pattern technique using a scanning electron microscope. A good qualitative agreement between textures measured using the three different techniques is obtained. Experimental aspects and potentials of the new technique are discussed.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Chester : International Union of Crystallography (IUCr)
    Journal of synchrotron radiation 4 (1997), S. 147-154 
    ISSN: 1600-5775
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: The large penetration power of high-energy X-rays (〉60 keV) raises interesting prospects for new types of structural characterizations of polycrystalline materials. It becomes possible in a non-destructive manner to perform local studies, within the bulk of the material, of the fundamental materials physics properties: grain orientations, strain, dislocation densities etc. In favourable cases these properties may be mapped in three dimensions with a spatial resolution that matches the dimensions of the individual grains. Imbedded volumes and interfaces become accessible. Moreover, the high energies allow better in-situ studies of samples in complicated environments (industrial process optimization). General techniques for research in this energy range have been developed using broad-band angle-dispersive methods, on-line two-dimensional detectors and conical slits. Characterizations have been made at the level of the individual grains and grain boundaries as well as on ensembles of grains. The spatial resolution is presently of the order of 10–100 μm. Four examples of applications are presented along with an outlook.
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  • 3
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: A fast and non-destructive method for generating three-dimensional maps of the grain boundaries in undeformed polycrystals is presented. The method relies on tracking of micro-focused high-energy X-rays. It is verified by comparing an electron microscopy map of the orientations on the 2.5 × 2.5 mm surface of an aluminium polycrystal with tracking data produced at the 3DXRD microscope at the European Synchrotron Radiation Facility. The average difference in grain boundary position between the two techniques is 26 µm, comparable with the spatial resolution of the 3DXRD microscope. As another extension of the tracking concept, algorithms for determining the stress state of the individual grains are derived. As a case study, 3DXRD results are presented for the tensile deformation of a copper specimen. The strain tensor for one embedded grain is determined as a function of load. The accuracy on the strain is Δε ∼ 10−4.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 50 (1994), S. 741-748 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: The statistical analysis of data in the form of orientations is a relatively new discipline and results from the literature on this subject are not yet widely known outside the statistics community. This paper provides an introduction to and the key references for statistical methods for analysing orientation data. More specifically, the problem of estimating an unknown orientation is considered and results on the precision of such an estimated orientation are described. The calculation of average orientation and dispersion parameters for a sample of orientations is also considered. Finally, procedures for generating and testing for random orientations are described. The methodology is illustrated with crystal orientation data obtained from the analysis of electron back-scattering patterns.
    Type of Medium: Electronic Resource
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